McGill TopSpinAddOns description (addons are available here with a McGill login or contact nmr.chemistry mcgill.ca (subject: Mnova%20software%20license%20request) (Kirill)).Introduction to processing with TopSpin.TopSpin quick installation instructions.TopSpin download link (requires account on the Bruker webpage).Material is available on the Workshops page. Workshops are run periodically about using TopSpin and Mnova. Bruker Nanoscope Analysis v1.90r1sr2 (contact milab.chemistry mcgill.ca (subject: Nanoscope%20Analysis%20request) (Mohini) for download link).3rd Party Software for Images (PC & Mac)įor GLAs see the page for the instrument you are interested in.Nanoscope Analysis 64 bit software for Win 7.NanoMechanical Video Need to login to Bruker PeakForce Quantitative NanoMechanical Mapping Tutorial.Scanning Probe Microscopy by John Cross.How to become a user of an AFM instrument.Users need to provide their own tips that are appropriate for their application. Information on how to become a AFM/SPM users are here. An Asylum Research-MFP Bio AFM with an inverted microscopy is described here. Used in constant current or height mode and as an Electrochemical STM. The STM is designed for atomic-scale resolution imaging of surfaces. A Digital Instruments STM with Nanoscope V controller: The newly-upgraded camera system allows easier operation. It is designed for atomic-scale resolution imaging of surfaces. The MultiMode-8 is equipped with ScanAsyst® automatic image optimization.
The MultiMode-8 is an upgrade of our Multimode-3 instrument. Click here for details.Ī MultiMode-8 AFM with Nanoscope V controller and A, E and J scanners: Particularly nanomechanical and nanoelectrical measurements. The Icon is primarily reserved for advanced AFM-based functions, The Dimension Icon AFM is equipped with ScanAsyst® automatic image optimization. A Bruker Dimension Icon AFM with Nanoscope V controller: Nate Lewis, the Beckman Institute, and the Chemistry an Chemical Engineering Division for making them possible. We have three Atomic Force Microscopes (AFM) and a Scanning Tunneling Microscope (STM).
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